Title :
Investigation of GIDL current Injection Disturb Mechanism in two-transistor-eNVM memory devices
Author :
Kim, Sung-Rae ; Han, K.J. ; Lee, Junmin ; Lee, P.Y. ; Zhou, Tony ; Lee, Kin-Sing ; Liu, Patty ; Tseng, Huan-Chung ; Cronguist, Brian
Author_Institution :
Actel Corp., Mountain View, CA 94043-4655, USA. Phone: (650) 318-7569, Fax: (650) 318-4601 e-mail: sung-rae.kim@actel.com
Keywords :
Contacts; Erbium; Failure analysis; Field programmable gate arrays; Logic; Nonvolatile memory; Random access memory; Routing; Switches; Table lookup;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796128
