Title :
Interface Traps in Silicon Carbide MOSFETs
Author :
Cochrane, C.J. ; Lenahan, P.M. ; Lelis, A.J.
Author_Institution :
Penn State University, University Park, PA 16802
Keywords :
MOSFETs; Silicon carbide;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796135
