DocumentCode :
2923242
Title :
Entrepreneurs´ response to failure in early stage technology ventures: A comparative study
Author :
Cotterill, Keith
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
fYear :
2011
fDate :
27-30 June 2011
Firstpage :
29
Lastpage :
39
Abstract :
Entrepreneurs develop new technology ventures in uncertain conditions with unproven technologies and limited resources. The majority of such ventures fail. Examining entrepreneurs´ attitudes to failure may reveal much about how entrepreneurs learn and how they identify subsequent opportunities. This paper examines how entrepreneurs´ attitudes to failure in early stage technology companies differ in the USA UK and Germany, and what this might reveal about entrepreneurial learning and opportunity identification in these countries. Using a qualitative approach, interviews with habitual entrepreneurs explore their experiences of failure. Based on this analysis and a review of the literature, a conceptual model of how to analyze failure is proposed. It is hoped this research will improve the preparedness of new entrepreneurs, with positive implications for future entrepreneurial success. The conceptual framework is presented as an approach to concentrate further research into entrepreneurial failure and contribute to a subsequent model of the wider entrepreneurial process. The industry focus on technology ventures, along with the comparative nature of the study, add to existing literature on entrepreneurial failure.
Keywords :
psychology; risk management; Germany; UK; USA; early stage technology ventures; entrepreneur attitude; entrepreneur response; entrepreneurial failure; entrepreneurial learning; opportunity identification; Companies; Context; Interviews; Silicon; Software; USA Councils; Failure; entrepreneurial failure; self-efficacy; stigma;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technology Management Conference (ITMC), 2011 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-61284-951-5
Type :
conf
DOI :
10.1109/ITMC.2011.5995927
Filename :
5995927
Link To Document :
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