DocumentCode :
2923304
Title :
"Reliability of Electrostatically Actuated RF MEMS Switches"
Author :
Hwang, James C. M.
Author_Institution :
Lehigh University, USA
fYear :
2007
fDate :
9-11 Dec. 2007
Keywords :
Analog integrated circuits; Integrated circuit modeling; Micromechanical devices; Oscillators; Radio frequency; Radiofrequency microelectromechanical systems; Semiconductor device modeling; Switches; Transceivers; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio-Frequency Integration Technology, 2007. RFIT 007. IEEE International Workshop on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1307-2
Electronic_ISBN :
978-1-4244-1308-9
Type :
conf
DOI :
10.1109/RFIT.2007.4444015
Filename :
4444015
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2923304
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