• DocumentCode
    2923357
  • Title

    "RF noise modelling with PSP"

  • Author

    Scholten, Andries

  • Author_Institution
    NXP Semiconductors, The Netherlands
  • fYear
    2007
  • fDate
    9-11 Dec. 2007
  • Keywords
    Biographies; Circuit testing; Communication standards; Integrated circuit modeling; Libraries; Radio frequency; Radiofrequency integrated circuits; Routing; Semiconductor device measurement; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology, 2007. RFIT 007. IEEE International Workshop on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1307-2
  • Electronic_ISBN
    978-1-4244-1308-9
  • Type

    conf

  • DOI
    10.1109/RFIT.2007.4444019
  • Filename
    4444019
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2923357