Title :
"RF noise modelling with PSP"
Author :
Scholten, Andries
Author_Institution :
NXP Semiconductors, The Netherlands
Keywords :
Biographies; Circuit testing; Communication standards; Integrated circuit modeling; Libraries; Radio frequency; Radiofrequency integrated circuits; Routing; Semiconductor device measurement; Semiconductor device modeling;
Conference_Titel :
Radio-Frequency Integration Technology, 2007. RFIT 007. IEEE International Workshop on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1307-2
Electronic_ISBN :
978-1-4244-1308-9
DOI :
10.1109/RFIT.2007.4444019
