Title :
The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs
Author :
Campbell, J.P. ; Qin, J. ; Cheung, K.P. ; Yu, L. ; Suehle, J.S. ; Oates, A. ; Sheng, K.
Author_Institution :
Semiconductor Electronics Division, NIST
Keywords :
MOSFETs; Telegraphy;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796143
