Title :
Zero Defects Quality and Reliability Challenges for Growing Markets
Author :
Dakshinamoorthy, S.
Author_Institution :
Vice President, Quality
Keywords :
Automotive engineering; Cellular networks; Chemical analysis; Design for testability; Lead compounds; Semiconductor device reliability; Semiconductor device testing; Six sigma; Timing; Trademarks;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796144
