Title :
Circuit Failure Prediction for Robust System Design
Author :
Mitra, Subhasish
Author_Institution :
Robust Systems Group, Departments of Electrical Eng. & Computer Sc., Stanford University. Email: subh@stanford.edu
Keywords :
Aging; Built-in self-test; Circuits; Clocks; Delay effects; Error correction; Robust control; Robustness; Sensor systems; Temperature sensors;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796145
