• DocumentCode
    2923427
  • Title

    RePRAM: Re-cycling PRAM faulty blocks for extended lifetime

  • Author

    Chen, Jie ; Venkataramani, Guru ; Huang, H. Howie

  • Author_Institution
    Dept. of Electr. & Compurer Engirrering, George Washington Univ., Washington, DC, USA
  • fYear
    2012
  • fDate
    25-28 June 2012
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    As main memory systems begin to face the scaling challenges from DRAM technology, future computer systems need to adapt to the emerging memory technologies like Phase-Change Memory (PCM or PRAM). While these newer technologies offer advantages such as storage density, non-volatility, and low energy consumption, they are constrained by limited write endurance that becomes more pronounced with process variation. In this paper, we propose a novel PRAM-based main memory system, RePRAM (Recycling PRAM), which leverages a group of faulty pages and recycles them in a managed way to significantly extend the PRAM lifetime while minimizing the performance impact. In particular, we explore two different dimensions of dynamic redundancy levels and group sizes, and design low-cost hardware and software support for RePRAM. Our proposed scheme involves minimal hardware modifications (that have less than 1% on-chip and off-chip area overheads). Also, our schemes can improve the PRAM lifetime by up to 43× (times) over a chip with no error correction capabilities, and outperform prior schemes such as DRM and ECP at a small fraction of the hardware cost. The performance overhead resulting from our scheme is less than 7% on average across 21 applications from SPEC2006, Splash-2, and PARSEC benchmark suites.
  • Keywords
    DRAM chips; phase change memories; redundancy; DRAM technology; DRM; ECP; PARSEC benchmark suites; PRAM faulty block recycling; PRAM-based main memory system; RePRAM; SPEC2006; Splash-2; dynamic redundancy levels; group sizes; lifetime extension; phase-change memory; Phase change materials; Phase change random access memory; USA Councils; Lifetime; Main memory; Performance; Phase Change Memory; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2012 42nd Annual IEEE/IFIP International Conference on
  • Conference_Location
    Boston, MA
  • ISSN
    1530-0889
  • Print_ISBN
    978-1-4673-1624-8
  • Electronic_ISBN
    1530-0889
  • Type

    conf

  • DOI
    10.1109/DSN.2012.6263950
  • Filename
    6263950