DocumentCode

2923496

Title

JEDEC - Tutorial; Everything you wanted to know But were afraid to ask

Author

Strong, Alvin

Author_Institution

Chair of JEDEC 14.2

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

1

Lastpage

30

Keywords

IEC standards; Logic testing; Microelectronics; Plastic packaging; Proposals; Read-write memory; Solid state circuits; Standards development; Standards publication; Tutorial;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International

Conference_Location

South lake Tahoe, CA, USA

ISSN

1930-8841

Print_ISBN

978-1-4244-2194-7

Electronic_ISBN

1930-8841

Type

conf

DOI

10.1109/IRWS.2008.4796150

Filename

4796150