Title :
Assessment of waist-worn tri-axial accelerometer based fall-detection algorithms using continuous unsupervised activities
Author :
Bourke, Alan K. ; Van de Ven, Pepijn ; Gamble, Mary ; O´Connor, Raymond ; Murphy, Kieran ; Bogan, Elizabeth ; McQuade, Eamonn ; Finucane, Paul ; ÓLaighin, Gearóid ; Nelson, John
Author_Institution :
Dept. of Electron. & Comput. Eng., Univ. of Limerick, Limerick, Ireland
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
This study aims to evaluate a variety of existing and novel fall detection algorithms, for a waist mounted accelerometer based system. Algorithms were tested against a comprehensive data-set recorded from 10 young healthy subjects performing 240 falls and 120 activities of daily living and 10 elderly healthy subjects performing 240 scripted and 52.4 hours of continuous unscripted normal activities. Results show that using a simple algorithm employing Velocity+Impact+Posture can achieve a low false-positive rate of less than 1 FP/day* (0.94FPs/day*) with a sensitivity of 94.6% and a specificity of 100%. The algorithms were tested using unsupervised continuous activities performed by elderly subjects living in the community, which is the target environment for a fall detection device.
Keywords :
accelerometers; biomedical measurement; geriatrics; patient care; patient monitoring; activities of daily living; continuous unsupervised activities; elderly healthy subjects; fall-detection algorithms; false-positive rate; velocity+impact+posture algorithmn; waist-worn tri-axial accelerometer; Accelerometers; Aging; Algorithm design and analysis; Detection algorithms; Senior citizens; Sensitivity; Sensors; Acceleration; Accidental Falls; Activities of Daily Living; Aged; Aged, 80 and over; Algorithms; Biomechanics; Biomedical Engineering; Equipment Design; False Positive Reactions; Female; Humans; Male; Monitoring, Ambulatory; Posture; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626364