Title :
Rapid thermal processing of high-efficiency silicon solar cells with controlled in-situ annealing
Author :
Doshi, P. ; Rohatgi, A. ; Ropp, M. ; Chen, Z. ; Ruby, D. ; Meier, D.L.
Author_Institution :
Univ. Center of Excellence for Photovoltaics Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Silicon solar cell efficiencies of 17.1%, 16.4%, 14.8%, and 14.9% have been achieved on FZ, Cz, multicrystalline (mc-Si), and dendritic web (DW) silicon, respectively, using simplified, cost-effective rapid thermal processing (RTP). These represent the highest reported efficiencies for solar cells processed with simultaneous front and back diffusion with no conventional high-temperature furnace steps. Appropriate diffusion temperature coupled with the added in-situ anneal resulted in suitable minority-carrier lifetime and diffusion profiles for high-efficiency cells. The cooling rate associated with the in-situ anneal can improve the lifetime and lower the reverse saturation current density (Jo), however, this effect is material and base resistivity specific. PECVD antireflection (AR) coatings provided low reflectance and efficient front surface and bulk defect passivation. Conventional cells fabricated on FZ silicon by furnace diffusions and oxidations gave an efficiency of 18.8% due to greater short wavelength response and lower Jo
Keywords :
CVD coatings; annealing; antireflection coatings; carrier lifetime; diffusion; elemental semiconductors; minority carriers; passivation; rapid thermal processing; semiconductor materials; silicon; solar cells; 14.8 to 18.8 percent; Cz silicon; FZ silicon; PECVD antireflection coatings; Si; Si solar cells; back diffusion; bulk defect passivation; controlled in-situ annealing; cooling rate; dendritic web silicon; diffusion profiles; diffusion temperature; front diffusion; furnace diffusions; high-efficiency silicon solar cells; low reflectance; minority-carrier lifetime; multicrystalline silicon; rapid thermal processing; reverse saturation current density; surface defect passivation; Coatings; Conductivity; Cooling; Current density; Furnaces; Photovoltaic cells; Rapid thermal annealing; Rapid thermal processing; Silicon; Temperature;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520184