Title :
The effects of solvent and dopant impurities on the performance of LPE silicon solar cells
Author :
Shi, Z. ; Zhang, W. ; Zheng, G.F. ; Chin, V.L. ; Stephens, A. ; Green, M.A. ; Bergmann, R.
Author_Institution :
Centre for Photovoltaic Devices & Syst., New South Wales Univ., Sydney, NSW, Australia
Abstract :
This paper reports the effect of solvent and dopant impurities on the performance of LPE silicon solar cells. For LPE layers grown from Sn and In based solutions and having similar surface morphology and resistivity, the performance of solar cells made on LPE layers grown from In was always higher than that of cells made on LPE layers grown using Sn as solvent. Consistently higher performance was also obtained from solar cells fabricated upon Ga-doped LPE layers than from cells made on Al-doped LPE silicon. The best cell was fabricated upon a Ga-doped LPE layer grown from In solution and had a total area efficiency of 16.4% confirmed by Sandia measurements. The observed phenomena are explained on the basis of Hall mobilities and minority carrier lifetimes of LPE layers grown from different solutions, and also the oxidation difference of these layers during cell processing
Keywords :
Hall mobility; aluminium; carrier lifetime; elemental semiconductors; gallium; impurities; liquid phase epitaxial growth; minority carriers; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; semiconductor materials; semiconductor thin films; silicon; solar cells; 16.4 percent; Al-doped LPE silicon; Ga-doped LPE layers; Hall mobilities; In based solution; LPE silicon solar cells; Sandia measurements; Si; Si:Al; Si:Ga; Sn based solution; dopant impurities; minority carrier lifetimes; resistivity; solvent; surface morphology; Area measurement; Charge carrier lifetime; Conductivity; Hall effect; Impurities; Photovoltaic cells; Silicon; Solvents; Surface morphology; Tin;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520194