Title :
A spectral k-means approach to bright-field cell image segmentation
Author :
Bradbury, Laura ; Wan, Justin W L
Author_Institution :
Comput. Math., Univ. of Waterloo, Waterloo, ON, Canada
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
Automatic segmentation of bright-field cell images is important to cell biologists, but difficult to complete due to the complex nature of the cells in bright-field images (poor contrast, broken halo, missing boundaries). Standard approaches such as level set segmentation and active contours work well for fluorescent images where cells appear as round shape, but become less effective when optical artifacts such as halo exist in bright-field images. In this paper, we present a robust segmentation method which combines the spectral and k-means clustering techniques to locate cells in bright-field images. This approach models an image as a matrix graph and segment different regions of the image by computing the appropriate eigenvectors of the matrix graph and using the k-means algorithm. We illustrate the effectiveness of the method by segmentation results of C2C12 (muscle) cells in bright-field images.
Keywords :
bio-optics; cellular biophysics; eigenvalues and eigenfunctions; fluorescence; graph theory; image segmentation; medical image processing; muscle; spectral analysis; statistical analysis; C2C12 cells; bright-field cell image segmentation; eigenvectors; fluorescent images; k-means clustering; matrix graph; muscle cells; robust segmentation method; spectral graph partitioning; Active contours; Approximation algorithms; Clustering algorithms; Image edge detection; Image segmentation; Microscopy; Pixel; Algorithms; Animals; Artificial Intelligence; Cell Line; Cell Tracking; Image Enhancement; Image Interpretation, Computer-Assisted; Mice; Muscle Fibers, Skeletal; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626380