Abstract :
The two-and-a-half-day technical program includes 62 paper presentations, four panels and four embedded tutorials. The paper sessions span many of the key areas in testing, such as BIST, Analog/Mixed-Signal Test, Current Test, On-Line Test, Validation/Verification, Scan and Boundary-Scan, Memory Test, Delay Test and ATPG. Also on the program are sessions on emerging areas that are gaining prominence, such as Testing Deep Submicron Circuits, Defect Level Test, Testing High Speed Circuits, Very Low Voltage Test, and Core based System-On-Chip Test
Keywords :
VLSI; integrated circuit testing; ATPG; BIST; VLSI testing; analog testing; boundary scan testing; core testing; current testing; deep submicron circuit testing; defect level testing; delay testing; high speed circuit testing; memory testing; mixed-signal testing; on-line testing; scan testing; system-on-chip testing; validation; verification; very low voltage testing;
