Title :
Characterization of silicon spheres for Spheral Solar cells
Author :
Arch, John K. ; Reynolds, Jeffrey S. ; Hammerbacher, Milfred D. ; Ahrenkiel, Richard K. ; Asher, Sally ; Jones, Kim M. ; Al-Jassim, Mowafak
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This paper discusses the accomplishments of a Cooperative Research and Development Agreement between Texas Instruments and the National Renewable Energy Laboratory (NREL). Secondary ion mass spectrometry (SIMS) has showed the predicted reduction in impurity levels due to silicon upgrading during Spheral Solar processing. Transmission electron microscopy (TEM) has uncovered defects near the surface of the spheres that could play a significant role in controlling sphere efficiency. Radio-frequency photoconductance decay (RF-PCD) measurements have shown significant promise as a predictor of the electrical performance of silicon spheres. An RF-PCD system similar to NREL´s has been constructed at Texas Instruments and is being prototyped as a real-time monitor of material quality during sphere processing
Keywords :
crystal defects; electron microscopy; elemental semiconductors; mass spectroscopy; photoconductivity; secondary ion mass spectroscopy; silicon; solar cells; transmission electron microscopy; Cooperative Research and Development Agreement; National Renewable Energy Laboratory; SIMS; Si; Si spheres; Spheral Solar cells; Texas Instruments; defects; electrical performance prediction; impurity levels reduction; material quality monitoring; radio-frequency photoconductance decay; secondary ion mass spectrometry; sphere efficiency; transmission electron microscopy; Impurities; Instruments; Laboratories; Mass spectroscopy; Photovoltaic cells; Radio frequency; Renewable energy resources; Research and development; Silicon; Transmission electron microscopy;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520200
