• DocumentCode
    2924548
  • Title

    Interconnect technologies and the thermal performance of MCM

  • Author

    Ozmat, Burhan

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • fYear
    1992
  • fDate
    5-8 Feb 1992
  • Firstpage
    226
  • Lastpage
    245
  • Abstract
    The author compares the thermal performance of multi-chip modules (MCMs) based on their interconnection technology. The comparisons were made for hermetic and conduction cooled use environments. The thermal performances of the chip-first high-density interconnect (HDI) technology, the flipped-chip (FC) technology, and flipped-tape automated bonding (FTAB) technologies were analyzed and compared for MCM applications. The results of the study showed the thermal performance of each interconnect technology and presented the most effective ways to improve the performance of MCMs
  • Keywords
    finite element analysis; flip-chip devices; multichip modules; tape automated bonding; FEM; FTAB; HDI; MCM; conduction cooled use; flipped TAB; flipped-chip; flipped-tape automated bonding; hermetic use; high-density interconnect; interconnection technology; multi-chip modules; thermal performance; Artificial intelligence; Conducting materials; Packaging; Performance analysis; Substrates; Temperature; Thermal conductivity; Thermal expansion; Thermal factors; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Phenomena in Electronic Systems, 1992. I-THERM III, InterSociety Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0503-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.1992.187768
  • Filename
    187768