DocumentCode
2924548
Title
Interconnect technologies and the thermal performance of MCM
Author
Ozmat, Burhan
Author_Institution
Texas Instrum., Dallas, TX, USA
fYear
1992
fDate
5-8 Feb 1992
Firstpage
226
Lastpage
245
Abstract
The author compares the thermal performance of multi-chip modules (MCMs) based on their interconnection technology. The comparisons were made for hermetic and conduction cooled use environments. The thermal performances of the chip-first high-density interconnect (HDI) technology, the flipped-chip (FC) technology, and flipped-tape automated bonding (FTAB) technologies were analyzed and compared for MCM applications. The results of the study showed the thermal performance of each interconnect technology and presented the most effective ways to improve the performance of MCMs
Keywords
finite element analysis; flip-chip devices; multichip modules; tape automated bonding; FEM; FTAB; HDI; MCM; conduction cooled use; flipped TAB; flipped-chip; flipped-tape automated bonding; hermetic use; high-density interconnect; interconnection technology; multi-chip modules; thermal performance; Artificial intelligence; Conducting materials; Packaging; Performance analysis; Substrates; Temperature; Thermal conductivity; Thermal expansion; Thermal factors; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal Phenomena in Electronic Systems, 1992. I-THERM III, InterSociety Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-0503-5
Type
conf
DOI
10.1109/ITHERM.1992.187768
Filename
187768
Link To Document