DocumentCode :
2924565
Title :
Effect of mold compound thermal conductivity on IC package thermal performance
Author :
Michael, M. ; Nguyen, L.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fYear :
1992
fDate :
5-8 Feb 1992
Firstpage :
246
Lastpage :
252
Abstract :
The authors discuss the effects of varying the thermal conductivity of epoxy molding compounds on the thermal behavior of plastic IC packages. Thermal conductivity values were estimated for various filler types (fused and crystalline silica, aluminum oxide, aluminum and boron nitride, silicon carbide, and diamond), sizes, and distribution. Values for the resulting composites were used in determining the effectiveness of the compound in dissipating heat away from the package. Finite-element simulation was also used to predict the thermal performance of three different surface mount configurations, namely, SOIC 8-L, 16-L wide, and 24-L wide. The combined effects of the thermally enhanced mold compounds and enhanced leadframe designs were investigated. Natural convection and forced convection heat transfer simulation determined the effectiveness of the high thermal conductivity encapsulants under different application conditions
Keywords :
encapsulation; finite element analysis; heat transfer; integrated circuit technology; packaging; polymers; surface mount technology; thermal analysis; thermal conductivity of solids; 16-L wide; 24-L wide; Al; Al2O3; BN; C; IC package; SMD; SOIC 8-L; SiC; SiO2; composites; crystalline silica; diamond; encapsulants; epoxy mould compound; filler materials; finite-element simulation; forced convection; fused silica; heat transfer simulation; leadframe designs; mold compound; natural convection; plastic packages; surface mount configurations; thermal conductivity; thermal performance; Aluminum oxide; Boron; Crystallization; Finite element methods; Integrated circuit packaging; Plastic integrated circuit packaging; Predictive models; Silicon carbide; Silicon compounds; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in Electronic Systems, 1992. I-THERM III, InterSociety Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0503-5
Type :
conf
DOI :
10.1109/ITHERM.1992.187769
Filename :
187769
Link To Document :
بازگشت