Title :
Field emission from mechanical pencil lead and graphite edges
Author :
Endo, Toshihiro ; Higuchi, Toshiharu ; Yamada, Yoichi ; Sasaki, Masahiro
Author_Institution :
Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
Abstract :
To clarify the origin of the superior FE characteristics observed from mechanical pencil lead, we have examined the FE features and the ambient gas effects on FE as well as FIM/FEM images of the edge of graphite flakes, consisting of vertically aligned graphene edges.
Keywords :
electron field emission; field emission electron microscopy; field emission ion microscopy; graphene; graphite; C; FIM-FEM images; field emission; field ion microscopy-field emission microscopy images; graphite flakes; mechanical pencil lead; vertically aligned graphene edge; Electric fields; Finite element methods; Fluctuations; Gases; Image edge detection; Iron; ambient gases; field emission; field emission microscopy; field ion microscopy; graphite; mechanical pencil lead;
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0368-2
DOI :
10.1109/IVESC.2012.6264185
