• DocumentCode
    2924812
  • Title

    A VDD independent temperature sensor circuit with scaled CMOS process

  • Author

    Oshiyama, H. ; Matsuda, T. ; Suzuki, K. ; Iwata, Hiroshi ; Ohzone, T.

  • Author_Institution
    Dept. Inf. Syst. Eng., Toyama Prefectural Univ., Imizu
  • fYear
    2009
  • fDate
    19-22 Jan. 2009
  • Firstpage
    111
  • Lastpage
    112
  • Abstract
    A supply voltage (VDD) independent temperature sensor circuit by a standard 90 nm CMOS process achieves the predicted errors about -1.0 to +2.0degC (-0.6 to +0degC) for the temperature range of -20 to +100degC (+20 to +80degC) for two-point calibration lines. This temperature sensor has a good tolerance to the change of VDD from 2.5 to 1.5 V, which corresponds to the measurement error of 0.9degC.
  • Keywords
    CMOS integrated circuits; calibration; measurement errors; temperature sensors; measurement error; scaled CMOS process; supply voltage independent sensor circuit; temperature -20 degC to 100 degC; temperature sensor; two-point calibration lines; CMOS analog integrated circuits; CMOS process; Circuit simulation; Information systems; Instruments; MOSFET circuits; Systems engineering and theory; Temperature distribution; Temperature sensors; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-2748-2
  • Electronic_ISBN
    978-1-4244-2749-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2009.4796457
  • Filename
    4796457
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2924812