Title :
A VDD independent temperature sensor circuit with scaled CMOS process
Author :
Oshiyama, H. ; Matsuda, T. ; Suzuki, K. ; Iwata, Hiroshi ; Ohzone, T.
Author_Institution :
Dept. Inf. Syst. Eng., Toyama Prefectural Univ., Imizu
Abstract :
A supply voltage (VDD) independent temperature sensor circuit by a standard 90 nm CMOS process achieves the predicted errors about -1.0 to +2.0degC (-0.6 to +0degC) for the temperature range of -20 to +100degC (+20 to +80degC) for two-point calibration lines. This temperature sensor has a good tolerance to the change of VDD from 2.5 to 1.5 V, which corresponds to the measurement error of 0.9degC.
Keywords :
CMOS integrated circuits; calibration; measurement errors; temperature sensors; measurement error; scaled CMOS process; supply voltage independent sensor circuit; temperature -20 degC to 100 degC; temperature sensor; two-point calibration lines; CMOS analog integrated circuits; CMOS process; Circuit simulation; Information systems; Instruments; MOSFET circuits; Systems engineering and theory; Temperature distribution; Temperature sensors; Threshold voltage;
Conference_Titel :
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-2748-2
Electronic_ISBN :
978-1-4244-2749-9
DOI :
10.1109/ASPDAC.2009.4796457
