Title :
Modeling of emission slump by ion bombardment of a Ba-dispenser cathode in an electron tube
Author :
Higuchi, Toshiharu ; Sasaki, Masahiro ; Matsumoto, Shuji ; Fukuda, Shigeki
Author_Institution :
Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
Abstract :
Emission distribution simulation on the cathode surface under ion bombardment shows greater ion bombardment damage on the cathode center than on the periphery. For example, for a klystron gun (5 × 10-8 Torr CO), 46% emission decay occurred on the cathode center, although total emission decayed only 2%.
Keywords :
barium; cathodes; electron emission; electron guns; klystrons; microwave tubes; Ba; Ba-dispenser cathode; cathode surface; electron tube; emission decay; emission distribution simulation; emission slump modelling; ion bombardment damage; klystron gun; Cathodes; Current density; Electron beams; Ion beams; Klystrons; Trajectory; dispenser cathodes; electron gun; emission slump; impregnated cathodes; ion bombardment; klystron;
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0368-2
DOI :
10.1109/IVESC.2012.6264200
