Title :
Cathode manufacturing: Relational data collection and process control system
Author :
Effgen, Michael P. ; Wolverton, Lindsey
Author_Institution :
Semicon Assoc., Lexington, KY, USA
Abstract :
This paper will discuss in a novel approach for applying multi-layered relational database that permits the use of both purchased and customized reporting software for data collection and process monitoring for the purpose of establishing best practices for control of manufacturing.
Keywords :
cathodes; electron device manufacture; process control; process monitoring; production engineering computing; relational databases; cathode manufacturing; customized reporting software; electron device industry; multilayered relational database; process control system; process monitoring; purchasing; relational data collection; Cathodes; Manufacturing; Monitoring; Process control; Relational databases; Reliability; Software; Data Collection; Process Control; Process Monitoring; Relational Database; SPC; Statistical Process Control;
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0368-2
DOI :
10.1109/IVESC.2012.6264202
