DocumentCode
2925028
Title
Cathode manufacturing: Relational data collection and process control system
Author
Effgen, Michael P. ; Wolverton, Lindsey
Author_Institution
Semicon Assoc., Lexington, KY, USA
fYear
2012
fDate
24-26 April 2012
Firstpage
473
Lastpage
474
Abstract
This paper will discuss in a novel approach for applying multi-layered relational database that permits the use of both purchased and customized reporting software for data collection and process monitoring for the purpose of establishing best practices for control of manufacturing.
Keywords
cathodes; electron device manufacture; process control; process monitoring; production engineering computing; relational databases; cathode manufacturing; customized reporting software; electron device industry; multilayered relational database; process control system; process monitoring; purchasing; relational data collection; Cathodes; Manufacturing; Monitoring; Process control; Relational databases; Reliability; Software; Data Collection; Process Control; Process Monitoring; Relational Database; SPC; Statistical Process Control;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4673-0368-2
Type
conf
DOI
10.1109/IVESC.2012.6264202
Filename
6264202
Link To Document