مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2925112

Title :

Ultrafast semiconductor measurements

Author :

Del, P.J.

Author_Institution :

Univ. of Central Florida

fYear :

2000

fDate :

7-12 May 2000

Firstpage :

357

Lastpage :

357

Abstract :

CWP 2:30 pm-4:i5 pm, Room 104. Presider: Peter J. Delfyett, Univ. of Central Florida, USA.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on

Conference_Location :

San Francisco, CA, USA

Print_ISBN :

1-55752-634-6

Type :

conf

DOI :

10.1109/CLEO.2000.907114

Filename :

907114

Link To Document :