Title :
Spatio-temporal carrier dynamics in photoconductive switches
Author :
Bieler, M. ; Koch, M. ; Hein, G. ; Pierz, K. ; Siegner, U.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Univ. Braunschweig, Germany
Abstract :
Summary form only given.We present the first experiments which directly visualize the spatial pattern formed by carriers in a photoconductive switch under the action of an electric bias field. These experiments lay the groundwork for further optimization of photoconductive switches as THz emitters or ultrafast photodetectors. This is because the spatial average over the motion of electrons and holes determines the properties of the current pulses and the subsequent impulsive THz radiation generated in the switch by femtosecond optical excitation. Our data demonstrate different electron-hole separations in the center and close to the edges of the non-uniform Gaussian carrier distribution created by the excitation laser pulses. A simple model assuming density dependent screening qualitatively reproduces the complicated experimental patterns.
Keywords :
III-V semiconductors; aluminium compounds; carrier mobility; gallium arsenide; high-speed optical techniques; photoconducting switches; semiconductor quantum wells; submillimetre wave devices; GaAs-AlGaAs; GaAs-AlGaAs MQW; THz emitters; complicated experimental patterns; density dependent screening; electric bias field; electron-hole separations; excitation laser pulses; femtosecond optical excitation; impulsive THz radiation generation; non-uniform Gaussian carrier distribution; optimization; photoconductive switches; spatial average; spatial pattern; spatio-temporal carrier dynamics; ultrafast photodetectors; Charge carrier processes; Electron optics; Laser excitation; Optical pulse generation; Optical switches; Photoconductivity; Photodetectors; Stimulated emission; Ultrafast optics; Visualization;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907117