Effect of outgassing on the field emission property of screen-printed CNTs

Author

Yunkang Cui ; Xiaobing Zhang ; Wei Lei ; Yunsong Di ; Jing Chen ; Qilong Wang

Author_Institution

Dept. of Basic Courses, Nanjing Inst. of Technol., Nanjing, China

fYear

2012

fDate

24-26 April 2012

Firstpage

561

Lastpage

562

Abstract

To study the mechanism of current degradation of a cold cathode, the outgassing measurement of a field emission diode with screen-printed CNTs cathode has been taken with a quadrupole mass spectrometer (QMS) in an ultra-high vacuum (UHV) system. It was found that the H₂, CO₂, and CO were outgassed from the diode during the working process. The field emission properties of the cold cathode, such as turn-on field, threshold field and the emission current density, were largely related to the pressure of the outgases. From the outgassing experimental results, the relations between the emission current degradation and the outgassing of field emission devices have been found.

Keywords

carbon compounds; carbon nanotubes; cathodes; current density; diodes; hydrogen; mass spectrometers; outgassing; CO₂; H₂; QMS; UHV system; carbon nanotubes; cold cathode; emission current degradation mechanism; emission current density; field emission device outgassing; field emission diode; field emission property; outgassing effect; outgassing measurement; quadrupole mass spectrometer; screen-printed CNT cathode; threshold field; turn-on field; ultrahigh vacuum system; working process; Carbon nanotubes; Cathodes; Current density; Degradation; Educational institutions; Scanning electron microscopy; Field emission property; Outgassing characteristics; printed CNTs cathode;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electron Sources Conference (IVESC), 2012 IEEE Ninth International

Conference_Location

Monterey, CA

Print_ISBN

978-1-4673-0368-2

Type

conf

DOI

10.1109/IVESC.2012.6264209

Filename

6264209