DocumentCode :
2925196
Title :
17.3: Work function reduction by multilayer oxides :Thermionic electron emission microscopy of scandium oxide and barium oxide on tungsten
Author :
Vaughn, Joel M. ; Jamison, Keith D. ; Kordesch, Martin E.
Author_Institution :
Dept. of Phys. & Astron., Ohio Univ., Athens, OH, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
421
Lastpage :
422
Abstract :
In this paper, thick (200 nm) layers of reactively sputtered Sc2O3 and BaO on tungsten (W) foil were examined. Thermionic electron emission microscopy (ThEEM) was used to image the surfaces during electron emission. Current vs. brightness temperature data were used to estimate the work function.
Keywords :
barium compounds; multilayers; scandium compounds; sputter deposition; thermionic electron emission; tungsten; work function; BaO-W; Sc2O3-W; brightness temperature data; current; multilayer oxide; reactive sputtering; thermionic electron emission microscopy; work function reduction; Barium; Brightness temperature; Cathodes; Electron emission; Extraterrestrial measurements; Nonhomogeneous media; Scanning electron microscopy; Temperature measurement; Thermionic emission; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503437
Filename :
5503437
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2925196
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