• DocumentCode
    2925196
  • Title

    17.3: Work function reduction by multilayer oxides :Thermionic electron emission microscopy of scandium oxide and barium oxide on tungsten

  • Author

    Vaughn, Joel M. ; Jamison, Keith D. ; Kordesch, Martin E.

  • Author_Institution
    Dept. of Phys. & Astron., Ohio Univ., Athens, OH, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    421
  • Lastpage
    422
  • Abstract
    In this paper, thick (200 nm) layers of reactively sputtered Sc2O3 and BaO on tungsten (W) foil were examined. Thermionic electron emission microscopy (ThEEM) was used to image the surfaces during electron emission. Current vs. brightness temperature data were used to estimate the work function.
  • Keywords
    barium compounds; multilayers; scandium compounds; sputter deposition; thermionic electron emission; tungsten; work function; BaO-W; Sc2O3-W; brightness temperature data; current; multilayer oxide; reactive sputtering; thermionic electron emission microscopy; work function reduction; Barium; Brightness temperature; Cathodes; Electron emission; Extraterrestrial measurements; Nonhomogeneous media; Scanning electron microscopy; Temperature measurement; Thermionic emission; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503437
  • Filename
    5503437
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2925196