DocumentCode :
2925224
Title :
17.4: Electron field emission from a Tetrapod-like ZnO film deposited on metal mesh by DC electrophoresis
Author :
Ma, Li-An ; Cai, Shu-Guang ; Hu, Li-Qin ; Guo, Tai-Liang
Author_Institution :
Dept. of Mater. Sci. & Eng., Fujian Univ. of Technol., Fuzhou, China
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
423
Lastpage :
424
Abstract :
A direct current (DC) electrophoresis deposition method (EPD) was used for preparing Tetrapod-like ZnO film cathode on stable and electrically conducting metal mesh substrates. Field-emission measurement reveals that the tetrapod-like ZnO film deposition on metal mesh posses a good emission property with very low turn-on electric fields of 1.95V/μm and low threshold field of ~3.8V/μm (for current density of 1mA/cm2). Furthermore, large emission current densities of 2.2 mA/cm2 were obtained at reasonably low fields of less than ~4.9 V/μm. These enhanced emission properties are attributed to the high-conductivity, stable nature of the mesh substrate onto which the Ag paste films are attached and weaker field-screening effect.
Keywords :
II-VI semiconductors; current density; electrical conductivity; electron density; electron field emission; electrophoretic coatings; semiconductor growth; semiconductor thin films; wide band gap semiconductors; zinc compounds; Ag; ZnO; direct current electrophoresis deposition method; electrical conductivity; electron field emission; large emission current density; thin film cathode; Cathodes; Conductive films; Current density; Current measurement; Density measurement; Electric variables measurement; Electrokinetics; Electron emission; Substrates; Zinc oxide; DC electrophoresis; ZnO; field emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503438
Filename :
5503438
Link To Document :
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