DocumentCode :
2925293
Title :
Thermal verification testing of commercial printed-circuit boards for spaceflight
Author :
Foster, William M., II
Author_Institution :
NASA Lewis Res. Center, Cleveland, OH, USA
fYear :
1992
fDate :
21-23 Jan 1992
Firstpage :
189
Lastpage :
195
Abstract :
A method developed to verify commercial printed-circuit boards for a Shuttle orbital flight is discussed. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. The temperature definition tests performed consist of infrared scanning, thermal vacuum testing, and preliminary thermal operational testing. Only the engineering unit is used for temperature definition testing, but the preliminary thermal operational testing is performed on the flight unit after the temperature range has been defined. Vibration testing is performed next, but most vibration failures cannot be detected without subsequent temperature cycling. Finally, final assembly testing is performed to simulate a Shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 h of trouble-free operation
Keywords :
aerospace instrumentation; aerospace testing; environmental testing; fault location; infrared imaging; printed circuit testing; thermal analysis; Shuttle orbital flight; commercial printed-circuit boards; early fault detection; infrared scanning; spaceflight; temperature definition tests; test sequence; thermal operational testing; thermal screening test; thermal vacuum testing; thermal verification testing; vibration failures; vibration testing; Aerospace engineering; Aerospace materials; Assembly; Fault detection; Materials testing; Performance evaluation; Process design; Temperature distribution; Thermal engineering; Thermal force;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1992. Proceedings., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-0521-3
Type :
conf
DOI :
10.1109/ARMS.1992.187821
Filename :
187821
Link To Document :
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