• DocumentCode
    2925301
  • Title

    A time resolution of plastic scintillation detector and its application to positron annihilation spectroscopy

  • Author

    Nam, K.Y. ; Joo, K.S. ; Oh, E.J. ; Park, T.S. ; Cho, G.S.

  • Author_Institution
    Dept. of Phys., Myong Ji Univ., Yongin, South Korea
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    546
  • Abstract
    We have measured the effect of the sizes and kinds of scintillators on the time resolution of the fast coincidence system. Two pairs BaF2 scintillation detectors with different sizes and one pair plastic scintillation detector was used in the measurement. After calibrating the TAC (time to amplitude converter), it was obtained that the time resolution of plastic scintillation system was better than others as ~300 ps when measured with 60Co for a 22Na energy window. In addition to that, we recognized that the resolution was dependent of the length of the delay line in the CFD (constant fraction discriminator) panel, neglecting the size of scintillators. We prepared three kinds of Polyaniline and used the fast coincidence system for positron annihilation spectroscopy to measure the positron lifetime. That is, the positron lifetime in solid state Polyaniline was measured as a function of three distinctive conductivities. We obtained the result that the lifetime of the positron decreases with increasing Polyaniline conductivity
  • Keywords
    positron annihilation; solid scintillation detectors; time measurement; BaF2; BaF2 scintillation detectors; Polyaniline; conductivity; delay line; plastic scintillation detector; positron annihilation spectroscopy; positron lifetime; time resolution; time to amplitude converter; Computational fluid dynamics; Conductivity; Delay lines; Energy measurement; Energy resolution; Plastics; Positrons; Scintillation counters; Size measurement; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.775200
  • Filename
    775200