DocumentCode
2925324
Title
18.3: Klystron lifetime and reliability analysis: Five year update
Author
Balkcum, Adam
Author_Institution
Commun. & Power Ind., Inc., Palo Alto, CA, USA
fYear
2010
fDate
18-20 May 2010
Firstpage
433
Lastpage
434
Abstract
Repair histories for over 1,000 klystrons of four fundamentally different design types and applications continue to be monitored. Statistical analysis of the failure data accumulated over nearly twenty years indicate mean time between failure values at the 90% confidence level ranging from 17 to 39 field service years for these devices. Comparison to the previous values indicates that the product lifetimes continue to improve.
Keywords
klystrons; reliability; statistical analysis; klystron lifetime; product lifetimes; reliability analysis; repair history; statistical analysis; Condition monitoring; Distribution functions; Failure analysis; Hazards; History; Klystrons; Power industry; Production; Sampling methods; Statistical analysis; MTBF; klystron;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-7098-3
Type
conf
DOI
10.1109/IVELEC.2010.5503443
Filename
5503443
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