DocumentCode :
2925324
Title :
18.3: Klystron lifetime and reliability analysis: Five year update
Author :
Balkcum, Adam
Author_Institution :
Commun. & Power Ind., Inc., Palo Alto, CA, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
433
Lastpage :
434
Abstract :
Repair histories for over 1,000 klystrons of four fundamentally different design types and applications continue to be monitored. Statistical analysis of the failure data accumulated over nearly twenty years indicate mean time between failure values at the 90% confidence level ranging from 17 to 39 field service years for these devices. Comparison to the previous values indicates that the product lifetimes continue to improve.
Keywords :
klystrons; reliability; statistical analysis; klystron lifetime; product lifetimes; reliability analysis; repair history; statistical analysis; Condition monitoring; Distribution functions; Failure analysis; Hazards; History; Klystrons; Power industry; Production; Sampling methods; Statistical analysis; MTBF; klystron;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503443
Filename :
5503443
Link To Document :
بازگشت