• DocumentCode
    2925324
  • Title

    18.3: Klystron lifetime and reliability analysis: Five year update

  • Author

    Balkcum, Adam

  • Author_Institution
    Commun. & Power Ind., Inc., Palo Alto, CA, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    433
  • Lastpage
    434
  • Abstract
    Repair histories for over 1,000 klystrons of four fundamentally different design types and applications continue to be monitored. Statistical analysis of the failure data accumulated over nearly twenty years indicate mean time between failure values at the 90% confidence level ranging from 17 to 39 field service years for these devices. Comparison to the previous values indicates that the product lifetimes continue to improve.
  • Keywords
    klystrons; reliability; statistical analysis; klystron lifetime; product lifetimes; reliability analysis; repair history; statistical analysis; Condition monitoring; Distribution functions; Failure analysis; Hazards; History; Klystrons; Power industry; Production; Sampling methods; Statistical analysis; MTBF; klystron;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503443
  • Filename
    5503443