• DocumentCode
    2925419
  • Title

    19.2: Modeling emission processes in the finite-element MICHELLE gun & collector simulation code

  • Author

    Petillo, John ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alex ; Kostas, Chris ; Jensen, Kevin ; Levush, Baruch ; Held, Ben ; DeFord, John ; Nelson, Eric

  • Author_Institution
    Sci. Applic. Int´´l Corp., Billerica, MA, USA
  • fYear
    2010
  • fDate
    18-20 May 2010
  • Firstpage
    441
  • Lastpage
    442
  • Abstract
    The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes, etc. have become a recent focus. The MICHELLE code´s ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that could not have been readily modeled in recent years. This presentation gives an overview of recent developments in the area of emission physics models including photoemission, dark current, and thermal beams with applications to time-dependent examples.
  • Keywords
    electron guns; electronic engineering computing; finite element analysis; particle beams; 2D particle beam formation; 3D particle beam formation; DC electron guns; MICHELLE code; RF electron guns; depressed collectors; emission processes; finite-element MICHELLE gun & collector simulation code; finite-element electrostatic particle in cell code; ion thrusters; photocathodes; Application software; Cathodes; Computational geometry; Electron guns; Electrostatics; Finite element methods; Particle beams; Radio frequency; Solid modeling; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2010 IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-7098-3
  • Type

    conf

  • DOI
    10.1109/IVELEC.2010.5503447
  • Filename
    5503447