DocumentCode :
2925419
Title :
19.2: Modeling emission processes in the finite-element MICHELLE gun & collector simulation code
Author :
Petillo, John ; Panagos, Dimitrios ; Ovtchinnikov, Serguei ; Burke, Alex ; Kostas, Chris ; Jensen, Kevin ; Levush, Baruch ; Held, Ben ; DeFord, John ; Nelson, Eric
Author_Institution :
Sci. Applic. Int´´l Corp., Billerica, MA, USA
fYear :
2010
fDate :
18-20 May 2010
Firstpage :
441
Lastpage :
442
Abstract :
The MICHELLE code is a Finite-Element Electrostatic Particle in Cell code for application to 2D and 3D particle beam formation, transport, and collection. Although its initial development focus had been for DC electron guns and depressed collectors, other applications such as RF electron guns, ion thrusters, photocathodes, etc. have become a recent focus. The MICHELLE code´s ability to manage large mesh sizes and large particle counts in complex geometries requiring the resolution of disparate spatial scales in 2D and 3D on desktop computers has allowed it to be applied to devices that could not have been readily modeled in recent years. This presentation gives an overview of recent developments in the area of emission physics models including photoemission, dark current, and thermal beams with applications to time-dependent examples.
Keywords :
electron guns; electronic engineering computing; finite element analysis; particle beams; 2D particle beam formation; 3D particle beam formation; DC electron guns; MICHELLE code; RF electron guns; depressed collectors; emission processes; finite-element MICHELLE gun & collector simulation code; finite-element electrostatic particle in cell code; ion thrusters; photocathodes; Application software; Cathodes; Computational geometry; Electron guns; Electrostatics; Finite element methods; Particle beams; Radio frequency; Solid modeling; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
Type :
conf
DOI :
10.1109/IVELEC.2010.5503447
Filename :
5503447
Link To Document :
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