DocumentCode :
2925561
Title :
Reliability-growth analysis for an Ada-coding process
Author :
Bailey, John H. ; Kowalski, Richard A.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
fYear :
1992
fDate :
21-23 Jan 1992
Firstpage :
280
Lastpage :
284
Abstract :
In a recent software development effort, an ARINC Research Corporation development team translated 500 system transactions into 11000 lines of code in Ada-compilable program design language (PDL). The team established rigorous data collection and review processes to collect and classify defect data and identify reliability growth in the PDL being produced. Two classes of defects for the coding process were defined: minor defects and logic defects. Data were collected by transaction, by defect type, and by lines of PDL. The defect analysis indicated that the learning process, and thus reliability growth, were different for the two defect classes. In addition, a period of reduced work load and changes in coding standards affected the observed defect rates for each class differently. As a result of this analysis effort, a database was established to track the coding process and to provide a basis for estimating various parameters of future efforts (e.g., time and cost) as well as the impact of process changes
Keywords :
Ada; software reliability; ARINC Research Corporation; Ada-coding process; Ada-compilable program design language; data collection; defect data classification; logic defects; minor defects; reliability growth; Control systems; Decision making; Distributed control; Flowcharts; Logic testing; Page description languages; Programming; Reliability engineering; Software reliability; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1992. Proceedings., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-0521-3
Type :
conf
DOI :
10.1109/ARMS.1992.187837
Filename :
187837
Link To Document :
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