DocumentCode :
2925571
Title :
Simultaneous third-harmonic generation and three-photon microscopy
Author :
Fittinghoff, D.N. ; Squier, J.A.
Author_Institution :
Inst. for Nonlinear Sci., California Univ., San Diego, La Jolla, CA, USA
fYear :
2000
fDate :
7-12 May 2000
Firstpage :
375
Abstract :
Summary form only given. The recent development of third-harmonic generation (THG) microscopy has demonstrated the potential of this technique for dynamic three-dimensional imaging of physical and biological systems, and the technique is already used to study laser-induced breakdown and nematic crystals. While it is known that the THG light is generated at interfaces in index of refraction or third-order nonlinear susceptibility, the exact contrast mechanisms are not yet well understood. In this work, we demonstrate for the first time a microscope that can simultaneously record registered THG and three-photon fluorescence (3PF) images to investigate the contrast mechanisms of THG microscopy compared with those of three-photon fluorescence microscopy. Because the contrast mechanisms differ they provide complementary information, and thus a more detailed view of the specimen results.
Keywords :
CCD image sensors; multiphoton processes; optical harmonic generation; optical microscopy; optical parametric amplifiers; THG light; THG microscopy; biological systems; dynamic three-dimensional imaging; exact contrast mechanisms; laser-induced breakdown; nematic crystals; third-harmonic generation; third-harmonic generation microscopy; third-order nonlinear susceptibility; three-photon fluorescence images; three-photon fluorescence microscopy; three-photon microscopy; Continuous wavelet transforms; Microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
Type :
conf
DOI :
10.1109/CLEO.2000.907140
Filename :
907140
Link To Document :
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