Eigen parameters of quasiperiodic Bragg layered structures

Author

Andreev, M.V. ; Borulko, V.F. ; Drobakhin, O.O. ; Sidorov, D.V.

Author_Institution

Oles Honchar Dnipropetrovsk Nat. Univ., Dnipropetrovsk, Ukraine

fYear

2015

fDate

21-24 April 2015

Firstpage

1

Lastpage

3

Abstract

The influence of various types of apodization on the eigen parameters of the distributed Bragg reflector, layered Bragg reflectors and resonators has been analyzed. The conditions of reduction of the quality factor of unwanted side Bragg oscillations in quasiperiodic apodized resonators have been determined. It has been proposed the construction of periodic and quasiperiodic structures and apodized Bragg resonators with thin contrast layers, which are relatively easy technologically implemented in the microwave range. The measurements results for periodic and quasiperiodic apodized structures and resonators with thin contrast layers are presented.

Keywords

Bragg gratings; eigenvalues and eigenfunctions; optical images; optical resonators; apodization; apodized Bragg resonators; distributed Bragg reflector; eigen parameters; layered Bragg reflectors; microwave range; quality factor; quasiperiodic apodized resonators; quasiperiodic apodized structures; quasiperiodic structures; thin contrast layers; unwanted side Bragg oscillations; Eigenvalues and eigenfunctions; Optical resonators; Periodic structures; Permittivity; Q-factor; Resonant frequency; Transmission line matrix methods; apodized Bragg resonators; eigen permittivity; eigenfrequencies; lumped elements; structure with thin contrast layers;

fLanguage

English

Publisher

ieee

Conference_Titel

Antenna Theory and Techniques (ICATT), 2015 International Conference on

Conference_Location

Kharkiv

Print_ISBN

978-1-4799-8556-2

Type

conf

DOI

10.1109/ICATT.2015.7136875

Filename

7136875