DocumentCode
2925691
Title
A novel thermal optimization flow using incremental floorplanning for 3D ICs
Author
Li, Xin ; Ma, Yuchun ; Hong, Xianlong
Author_Institution
Dept. of Comput. Sci.&Technol., Tsinghua Univ., Beijing
fYear
2009
fDate
19-22 Jan. 2009
Firstpage
347
Lastpage
352
Abstract
Thermal issue is a critical challenge in 3D IC design. To eliminate hotspots, physical layouts are always adjusted by shifting or duplicating hot blocks. However, these modifications may degrade the packing area as well as interconnect distribution greatly. In this paper, we propose some novel thermal-aware incremental changes to optimize these multiple objectives including thermal issue in 3D ICs. Furthermore, to avoid random incremental modification, which may be inefficient and need long runtime to converge, here potential gain is modeled for each candidate incremental change. Based on the potential gain, a novel thermal optimization flow to intelligently choose the best incremental operation is presented. We distinguish the thermal-aware incremental changes in three different categories: migrating computation, growing unit and moving hotspot. Mixed integer linear programming (MILP) models are devised according to these different incremental changes. Experimental results show that migrating computation, growing unit and moving hotspot can reduce max on-chip temperature by 7%, 13% and 15% respectively on MCNC/GSRC benchmarks. Still, experimental results also show that the thermal optimization flow can reduce max on-chip temperature by 14% compared to an existing 3D floorplan tool CBA, and achieve better area and total wirelength improvement than individual operations do.
Keywords
integer programming; integrated circuit interconnections; integrated circuit layout; linear programming; 3S IC design; incremental floorplanning; interconnect distribution; mixed integer linear programming; onchip temperature; thermal optimization flow; thermal-aware incremental changes; wirelength improvement; Computer science; Constraint optimization; Delay; Design optimization; Runtime; Temperature; Thermal conductivity; Thermal degradation; Thermal management; Three-dimensional integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
978-1-4244-2748-2
Electronic_ISBN
978-1-4244-2749-9
Type
conf
DOI
10.1109/ASPDAC.2009.4796505
Filename
4796505
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