DocumentCode
2925698
Title
P4-11: Secondary electron emission database
Author
Safier, Pedro N. ; Yater, Joan E. ; Myers, Robert E. ; Levush, Baruch
Author_Institution
S&J Solutions LLC, Alexandria, VA, USA
fYear
2010
fDate
18-20 May 2010
Firstpage
467
Lastpage
468
Abstract
We present measurements of secondary electron emission obtained with a new NRL measurement system. This system allows us to measure in two orthogonal angular directions, the energy-dependent emission for different incident angles and beam energies.
Keywords
secondary electron emission; NRL measurement system; beam energies; energy-dependent emission; incident angles; multi-stage depressed collectors; secondary electron emission; Abstracts; Current measurement; Databases; Detectors; Electrodes; Electron beams; Electron emission; Energy measurement; Laboratories; Plasma measurements; multi-stage depressed collectors; secondary electron emission; simulations;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-7098-3
Type
conf
DOI
10.1109/IVELEC.2010.5503460
Filename
5503460
Link To Document