DocumentCode :
2925845
Title :
Time-Resolved Characterization of All-Optical Switch Utilizing GaN Intersubband Transition
Author :
Iizuka, N. ; Kaneko, K. ; Suzuki, N.
Author_Institution :
Corporate Research & Development Center, Toshiba Corp., Japan nori.iizuka@toshiba.co.jp
fYear :
2005
fDate :
30-02 Aug. 2005
Firstpage :
1279
Lastpage :
1280
Abstract :
All-optical gate switching with a high extinction ratio was characterized. A faster and a slower decay component were observed. The slower one will be suppressed with optimized quantum well structures and properly selected operation wavelengths.
Keywords :
Absorption; Communication switching; Delay; Extinction ratio; Gallium nitride; Optical pulses; Optical waveguides; Pulse measurements; Pulse modulation; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN :
0-7803-9242-6
Type :
conf
DOI :
10.1109/CLEOPR.2005.1569720
Filename :
1569720
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2925845
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