DocumentCode
2925861
Title
Three-dimensional integration technology and integrated systems
Author
Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu
Author_Institution
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai
fYear
2009
fDate
19-22 Jan. 2009
Firstpage
409
Lastpage
415
Abstract
A three-dimensional (3-D) integration technology based on the wafer-to-wafer bonding using through silicon vias (TSV´s) has been developed for the fabrication of new 3-D LSIs. A 3-D image sensor chip, 3-D shared memory chip, 3-D artificial retina chip and 3-D microprocessor test chip have been fabricated by using this technology. In addition, we have proposed a new reconfigurable parallel image processing system. To achieve this system, we have proposed a new 3-D integration technology based on multichip-to-wafer bonding called a super-chip integration. Many chips are simultaneously aligned and bonded onto lower chips using a self-assembly technique in a super-chip integration.
Keywords
large scale integration; wafer bonding; 3D LSI; integrated systems; multichip-to-wafer bonding; reconfigurable parallel image processing system; self-assembly technique; super-chip integration; three-dimensional integration technology; through silicon vias; wafer-to-wafer bonding; Biomedical engineering; Capacitance; Fabrication; Integrated circuit interconnections; Large scale integration; Microprocessors; Silicon; Testing; Wafer bonding; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
978-1-4244-2748-2
Electronic_ISBN
978-1-4244-2749-9
Type
conf
DOI
10.1109/ASPDAC.2009.4796515
Filename
4796515
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