• DocumentCode
    2925861
  • Title

    Three-dimensional integration technology and integrated systems

  • Author

    Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu

  • Author_Institution
    Dept. of Bioeng. & Robot., Tohoku Univ., Sendai
  • fYear
    2009
  • fDate
    19-22 Jan. 2009
  • Firstpage
    409
  • Lastpage
    415
  • Abstract
    A three-dimensional (3-D) integration technology based on the wafer-to-wafer bonding using through silicon vias (TSV´s) has been developed for the fabrication of new 3-D LSIs. A 3-D image sensor chip, 3-D shared memory chip, 3-D artificial retina chip and 3-D microprocessor test chip have been fabricated by using this technology. In addition, we have proposed a new reconfigurable parallel image processing system. To achieve this system, we have proposed a new 3-D integration technology based on multichip-to-wafer bonding called a super-chip integration. Many chips are simultaneously aligned and bonded onto lower chips using a self-assembly technique in a super-chip integration.
  • Keywords
    large scale integration; wafer bonding; 3D LSI; integrated systems; multichip-to-wafer bonding; reconfigurable parallel image processing system; self-assembly technique; super-chip integration; three-dimensional integration technology; through silicon vias; wafer-to-wafer bonding; Biomedical engineering; Capacitance; Fabrication; Integrated circuit interconnections; Large scale integration; Microprocessors; Silicon; Testing; Wafer bonding; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-2748-2
  • Electronic_ISBN
    978-1-4244-2749-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2009.4796515
  • Filename
    4796515