DocumentCode :
2925920
Title :
A smart failure mode and effect analysis package
Author :
Kara-zaitri, Chakib ; Keller, Alfred Z. ; Fleming, Paul V.
Author_Institution :
Dept. of Ind. Technol., Bradford Univ., UK
fYear :
1992
fDate :
21-23 Jan 1992
Firstpage :
414
Lastpage :
421
Abstract :
A methodology combining the benefits of matrix FMEA (failure modes and effects analysis) and the risk priority number (RPN) technique is presented. The matrix approach is improved to provide an organized and traceable analysis from the piece part failure mode through all indenture levels to system-level failure effects. First, a single synthesized matrix capable of modeling an entire system and storing all individual item matrices in a compact and efficient manner is developed. Second, a methodology based on the probabilistic combination of RPNs is improved further. An RPN is calculated for every cause of failure by multiplying together severity, occurrence, and detection ratings (values between one and ten). The probabilistic approach is used to calculate local and global priority indices (PIs) which reflect the importance of an event relating to the indenture level under consideration and to the entire system, respectively. The matrix and the PI calculations have been incorporated in a computer program implemented on an IBM PC. One of the main features of the program is an interactive and intelligent browsing facility whereby an event can be traced horizontally or vertically from piece parts to system level and vice versa
Keywords :
engineering computing; failure analysis; matrix algebra; FMEA package; IBM PC; detection ratings; failure modes and effects analysis; matrix FMEA; occurrence ratings; piece part failure mode; priority indices; probabilistic approach; risk priority number; severity ratings; system-level failure effects; Aerospace electronics; Aerospace industry; Application software; Automotive engineering; Electronics industry; Failure analysis; Fault diagnosis; Packaging; Product design; Rails;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1992. Proceedings., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-0521-3
Type :
conf
DOI :
10.1109/ARMS.1992.187857
Filename :
187857
Link To Document :
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