DocumentCode
2926080
Title
Accounting for non-linear dependence using function driven component analysis
Author
Cheng, Lerong ; Gupta, Puneet ; He, Lei
Author_Institution
Dept. of Electr. Eng., Univ. of California, Los Angeles, CA
fYear
2009
fDate
19-22 Jan. 2009
Firstpage
474
Lastpage
479
Abstract
Majority of practical multivariate statistical analyses and optimizations model interdependence among random variables in terms of the linear correlation among them. Though linear correlation is simple to use and evaluate, in several cases non-linear dependence between random variables may be too strong to ignore. In this paper, We propose polynomial correlation coefficients as simple measure of multivariable non-linear dependence and show that need for modeling non-linear dependence strongly depends on the end function that is to be evaluated from the random variables. Then, we calculate the errors in estimation which result from assuming independence of components generated by linear de-correlation techniques such as PCA and ICA. The experimental result shows that the error predicted by our method is within 1% error compared to the real simulation. In order to deal with non-linear dependence, we further develop a target function driven component analysis algorithm (FCA) to minimize the error caused by ignoring high order dependence and apply such technique to statistical leakage power analysis and SRAM cell noise margin variation analysis. Experimental results show that the proposed FCA method is more accurate compared to the traditional PCA or ICA.
Keywords
SRAM chips; decorrelation; electrical faults; statistical analysis; SRAM cell margin variation analysis; function driven component analysis algorithm; linear decorrelation techniques; multivariate statistical analyses; polynomial correlation coefficients; statistical leakage power analysis; Algorithm design and analysis; CMOS technology; Helium; Independent component analysis; Mutual information; Polynomials; Principal component analysis; Random variables; Statistical analysis; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
978-1-4244-2748-2
Electronic_ISBN
978-1-4244-2749-9
Type
conf
DOI
10.1109/ASPDAC.2009.4796525
Filename
4796525
Link To Document