Title :
Adaptive frequency sampling of scattering parameters obtained by electromagnetic simulation
Author :
Ureel, J. ; Fache, N. ; De Zutter, D. ; Lagasse, P.
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Abstract :
In order to obtain the frequency response, a considerable amount of computation time in electromagnetic simulation is spent on the evaluation of a particular electromagnetic quantity in a user given number of discrete frequencies. The total number of, method of moments, simulations has been limited by using a rational function approximation based on derivative information of that quantity. This technique was used in order to obtain the far-field or induced current of antenna or scattering problems. Little has been done or published on adaptive frequency sampling, i.e. an algorithm for selecting additional frequencies in regions where the approximation exceeds some error measure, and for maximising the information provided by each new sample point. We propose general scheme based on the residual errors of the derivatives. The applicability of this scheme is illustrated with some well chosen examples. In these examples, the S-parameters of microstrip planar structures are calculated by a full-wave electromagnetic simulation.<>
Keywords :
adaptive signal processing; approximation theory; circuit analysis computing; electromagnetic wave scattering; electromagnetism; frequency response; method of moments; microstrip components; signal sampling; transfer functions; S-parameters; adaptive frequency sampling; antenna problems; electromagnetic simulation; error measure; far-field; frequency response; full-wave electromagnetic simulation; induced current; method of moments; microstrip planar structures; rational function approximation; residual errors; scattering parameters; scattering problems; transfer function; Antenna measurements; Approximation algorithms; Computational modeling; Electromagnetic scattering; Frequency measurement; Frequency response; Function approximation; Moment methods; Sampling methods; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-2009-3
DOI :
10.1109/APS.1994.407884