Title :
Finite-difference analysis of open and short circuits in coplanar MMICs including finite metallization thickness and mode conversion
Author :
Beilenhoff, K. ; Heinrich, W. ; Hartnagel, H.L.
Author_Institution :
Inst. fuer Hochfrequenztech. Tech. Hochschule Darmstadt, Germany
Abstract :
Open and short circuits as used in MMICs (monolithic microwave integrated circuits) are investigated by means of a finite difference method in the frequency domain. Both mode conversion and finite metallization thickness are accounted for. For the open stub, noticeable mode conversion is observed, whereas the short circuit behavior shows a significant dependence on metallization thickness.<>
Keywords :
MMIC; electrical faults; finite difference methods; frequency-domain analysis; metallisation; coplanar MMIC; finite difference method; finite metallization thickness; mode conversion; monolithic microwave integrated circuits; open stub; short circuits; Capacitance; Circuits; Coplanar waveguides; Finite difference methods; Frequency domain analysis; Inductance; MMICs; Metallization; Scattering; Transmission lines;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.187918
