Title :
Analysis of intermodulation distortion in GaAs/AlGaAs HBT´s
Author :
Teeter, D.A. ; Karakucuk, M. ; East, J.R. ; Haddad, G.I.
Author_Institution :
Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
Abstract :
An attempt has been made to explain the third-order intermodulation distortion properties of the heterojunction bipolar transistor (HBT) at millimeter wave frequencies. The frequency and bias dependence of the third-order intercept point is presented for a typical HBT. A conventional tuner system was used for measurements from 8 to 16 GHz. Beyond 27 GHz, an active load pull system was used to circumvent insertion loss problems. Appropriate corrections to the active load pull intercept measurements are described. To aid in understanding the measured results, a simple model which includes transit time effects was developed. From the measured and modeled results, it was found that reductions in V/sub ce/ resulted in a reduction in third-order intercept point. This degradation was attributed to increased nonlinearity in base collector capacitance.<>
Keywords :
III-V semiconductors; aluminium compounds; electric distortion; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; intermodulation measurement; microwave measurement; semiconductor device models; semiconductor device testing; solid-state microwave devices; 27 to 35 GHz; 8 to 16 GHz; EHF; GaAs-AlGaAs; HBT; MM-wave operation; SHF; active load pull system; base collector capacitance; bias dependence; frequency dependence; heterojunction bipolar transistor; intermodulation distortion; load pull intercept measurements; millimeter wave frequencies; model; third-order IMD; third-order intercept point; transit time effects; Distortion measurement; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Insertion loss; Intermodulation distortion; Millimeter wave measurements; Millimeter wave transistors; Time measurement; Tuners;
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-0611-2
DOI :
10.1109/MWSYM.1992.187962