Title :
The use of FDFD method for obtaining dispersion characteristics of asymmetric coupled anisotropic rectangular dielectric waveguides
Author :
Pinheiro, H.F. ; Giarola, A.J. ; da Silvs Souza Sobrinho, C.L.
Author_Institution :
Sch. of Electr. Eng., Univ. Estadual de Campinas, Sao Paulo, Brazil
Abstract :
The effect of varying the transverse dimensions of coupled rectangular anisotropic waveguides on the propagation characteristics of these waveguides was analyzed using the FDFD method. While the experimental data were obtained for uniaxial anisotropic dielectrics with a step index of refraction profile in the waveguide cross section, the formulation is also applicable to biaxial anisotropic dielectrics, with a combination of step and continuously varying index of refraction profile in the waveguide cross section. The results show that the effective dielectric constant is more influenced at the lower frequencies by the (B/sub 2//B/sub 1/) dimensions´ ratio and at the higher frequencies by the (A/sub 2//A/sub 1/) dimensions´ ratio when the optical axis is positioned along the y direction. When the optical axis is positioned along the x direction an opposite behavior is observed.<>
Keywords :
dielectric waveguides; dispersion (wave); electromagnetic wave propagation; electromagnetic wave refraction; finite difference time-domain analysis; permittivity; rectangular waveguides; waveguide theory; FDFD method; asymmetric coupled anisotropic rectangular dielectric waveguides; biaxial anisotropic dielectrics; dispersion characteristics; effective dielectric constant; optical axis; propagation characteristics; refraction profile; transverse dimensions; uniaxial anisotropic dielectrics; waveguide cross section; Anisotropic magnetoresistance; Dielectric constant; Dielectric devices; Electrooptical waveguides; Frequency; Optical coupling; Optical filters; Optical waveguides; Permittivity; Rectangular waveguides;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-2009-3
DOI :
10.1109/APS.1994.407988