• DocumentCode
    2927004
  • Title

    A criticality-driven microarchitectural three dimensional (3D) floorplanner

  • Author

    Sridharan, Srinath ; DeBole, Michael ; Sun, Guangyu ; Xie, Yuan ; Narayanan, Vijaykrishnan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA
  • fYear
    2009
  • fDate
    19-22 Jan. 2009
  • Firstpage
    763
  • Lastpage
    768
  • Abstract
    As technology scales, interconnect delays begin to dominate the performance of modern microprocessors. The ability to reduce the length of global wires has become an important design constraint, however only a subset of those global wires is critical for determining performance. The introduction of three-dimensional (3D) ICs has created the opportunity to reduce global wiring lengths and shorter interconnect delays through the intelligent placement of functional blocks. In this paper, a floorplanner for 3D chips is proposed that organizes functional blocks according to critical microarchitectural communication paths. The floorplanner identifies the potential triggers, in the form of feedback delays, which are responsible for the largest communication costs and places the contributing functional blocks in such a way that those costs are minimized. With our criticality driven 3D placement there is an average IPC improvement of 22% over 2D placement. Over criticality unaware 3D placement, criticality driven 3D placement shows an average IPC improvement of 8%.
  • Keywords
    circuit layout; delays; microprocessor chips; 3D chips; criticality-driven microarchitectural three dimensional floorplanner; feedback delays; functional blocks intelligent placement; global wires; interconnect delays; microarchitectural communication paths; Cost function; Delay; Feedback loop; Microarchitecture; Microprocessors; Pipelines; Stacking; Sun; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-2748-2
  • Electronic_ISBN
    978-1-4244-2749-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2009.4796572
  • Filename
    4796572