Title :
Self-adjusting constrained random stimulus generation using splitting evenness evaluation and XOR constraints
Author :
Deng, Shujun ; Kong, Zhiqiu ; Bian, Jinian ; Zhao, Yanni
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing
Abstract :
Constrained random stimulus generation plays significant roles in hardware verification nowadays, and the quality of the generated stimuli is key to the efficiency of the test process. In this work, we present a linear dynamic method to guide random stimulus generation by SAT solvers. A splitting simplified Min-Distance-Sum evaluation method and an XOR sampling strategy are integrated in the self-adjusting random stimulus generation framework. The evenness of the split groups is evaluated to find out some uneven parts. Then, random partial solutions for the uneven parts and random XOR constraints for the other inputs are added into constraints to get better distributed stimuli. Experimental results show that our method can evaluate the evenness as well as more complex formulae for stimulus generation, and also confirm that the self-adjusting method can improve the fault coverage ratio by more than 17% averagely with the same number of stimuli.
Keywords :
formal verification; logic gates; XOR sampling strategy; hardware verification; linear dynamic method; min-distance-sum evaluation method; self-adjusting constrained random stimulus generation; splitting evenness evaluation; Automatic testing; Binary decision diagrams; Circuit faults; Circuit simulation; Circuit testing; Computer science; Formal verification; Hardware; Monitoring; Sampling methods;
Conference_Titel :
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-2748-2
Electronic_ISBN :
978-1-4244-2749-9
DOI :
10.1109/ASPDAC.2009.4796573