DocumentCode
2927101
Title
11.1: A reliable improved Spindt cathode design for high currents
Author
Spindt, Capp ; Holland, Christopher E. ; Schwoebel, Paul R.
Author_Institution
Micro Sci. Eng. Labs., SRI Int., Menlo Park, CA, USA
fYear
2010
fDate
18-20 May 2010
Firstpage
201
Lastpage
202
Abstract
Recent work with Spindt cathodes has shown that past unreliable behavior has not been due to poor tip uniformity and the failure of over-achieving tips as has been widely believed. Rather the failures have been due to flashover along oxide walls in the cathode cavities. A new cavity architecture has solved the problem, and enabled greatly improved performance.
Keywords
cathodes; field emitter arrays; Spindt cathode design; cathode cavities; cavity architecture; high currents; tip uniformity; Cathodes; Design engineering; Electron emission; Field emitter arrays; Flashover; Laboratories; Reliability engineering; Silicon; Testing; Vacuum breakdown; Cold cathodes; Field emission; Field emitter array; Spindt cathode;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-7098-3
Type
conf
DOI
10.1109/IVELEC.2010.5503534
Filename
5503534
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