Title :
11.1: A reliable improved Spindt cathode design for high currents
Author :
Spindt, Capp ; Holland, Christopher E. ; Schwoebel, Paul R.
Author_Institution :
Micro Sci. Eng. Labs., SRI Int., Menlo Park, CA, USA
Abstract :
Recent work with Spindt cathodes has shown that past unreliable behavior has not been due to poor tip uniformity and the failure of over-achieving tips as has been widely believed. Rather the failures have been due to flashover along oxide walls in the cathode cavities. A new cavity architecture has solved the problem, and enabled greatly improved performance.
Keywords :
cathodes; field emitter arrays; Spindt cathode design; cathode cavities; cavity architecture; high currents; tip uniformity; Cathodes; Design engineering; Electron emission; Field emitter arrays; Flashover; Laboratories; Reliability engineering; Silicon; Testing; Vacuum breakdown; Cold cathodes; Field emission; Field emitter array; Spindt cathode;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
DOI :
10.1109/IVELEC.2010.5503534
