Title :
Comparison of measurement based and site specific ray based microcellular path loss predictions
Author :
Piazzi, Leonard ; Liang, George ; Bertoni, Henry L. ; Kim, Seongcheol
Author_Institution :
Center for Adv. Technol. in Telecommun., Polytech. Univ., Brooklyn, NY, USA
fDate :
29 Sep-2 Oct 1996
Abstract :
The development of mature systems for personal communication services (PCS) are envisioned to employ base station antennas at lamp post heights covering distances of 1 km or less. Prediction of the path loss for such low antennas is required to determine the actual shape of individual cells, and to evaluate interference with neighboring cells. The performance of site specific ray tracing methods based on UTD to predict the path loss are compared against measurement based models and measurements. An empirical formulation based on a simple least squares regression fit from one site is used as a prediction tool at another site having similar building environment. Comparing the accuracy of both types of prediction models, it is found that the site specific method provides an improvement over the traditional method of measurement based path loss prediction
Keywords :
UHF radio propagation; cellular radio; geometrical theory of diffraction; land mobile radio; least squares approximations; loss measurement; personal communication networks; radiofrequency interference; ray tracing; PCS; UHF band; UTD; base station antennas; building environment; empirical formulation; interference; lamp post heights; least squares regression fit; measurement based models; measurement based path loss; microcellular path loss predictions; performance; personal communication services; prediction models accuracy; prediction tool; site specific ray based path loss; site specific ray tracing methods; Antenna measurements; Base stations; Interference; Lamps; Loss measurement; Performance loss; Personal communication networks; Predictive models; Ray tracing; Shape;
Conference_Titel :
Universal Personal Communications, 1996. Record., 1996 5th IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-3300-4
DOI :
10.1109/ICUPC.1996.562655