Title :
Dependable VLSI: Device, design and architecture - How should they cooperate?
Author :
Sakai, Shuichi ; Onodera, Hidetoshi ; Yasuura, Hiroto ; Hoe, James C.
Author_Institution :
Univ. of Tokyo, Tokyo
Abstract :
VLSI dependability is one of the most significant issues in the modern world. Here the panelists will discuss the key technologies for it as well as the cost optimization among device, design and architecture.
Keywords :
VLSI; costing; integrated circuit design; integrated circuit reliability; VLSI dependability; VLSI design; cost optimization; very large scale integration architecture; Availability; Computer architecture; Cost function; Cryptography; Design optimization; Load flow control; Protection; Redundancy; Safety; Very large scale integration;
Conference_Titel :
Design Automation Conference, 2009. ASP-DAC 2009. Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-2748-2
Electronic_ISBN :
978-1-4244-2749-9
DOI :
10.1109/ASPDAC.2009.4796588
