Title :
[Copyright notice]
Abstract :
The following topics are dealt with: electron devices; process technology; CMOS devices; displays, sensors and MEMS; reliability and yield; quantum, power and compound semiconductor devices; solid state and nanoelectronic devices; modelling and simulation; and memory technology.
Keywords :
CMOS integrated circuits; display devices; micromechanical devices; semiconductor devices; sensors; CMOS devices; MEMS; compound semiconductor devices; displays; electron devices; memory technology; modelling; nanoelectronic devices; power semiconductor devices; process technology; quantum semiconductor devices; reliability; sensors; simulation; solid state devices; yield;
Conference_Titel :
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2377-4
DOI :
10.1109/IEDM.2008.4796593
